AtomicForceMicroscope

Atomic Force Microscope (AFM)
An Atomic Force Microscope (AFM) is a high-resolution type of scanning probe microscope that enables scientists to view and measure surfaces at the nanometer scale. Unlike traditional microscopes that use light or electrons, AFMs use a sharp probe that physically touches a surface to map its structure atom by atom.

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The probe is mounted on a cantilever, which bends in response to the tiny forces between the tip and the surface. A laser reflects off the cantilever and is detected by a sensor, which records the deflections to create a detailed topographical image of the sample.